Secondary Ion Mass Spectrometry (SIMS) is an analytical technique used to measure the composition of solid surfaces. A primary ion beam (oxygen or cesium) interacts with the sample surface, removing ions from the sample. These secondary ions are measured by a mass spectrometer to determine the elemental, isotopic, or molecular composition of the surface.
The Cameca 6f in the ASU SIMS Lab is great at...
- light isotope studies (e.g., D/H, B isotopes, Li isotopes)
- determining volatile contents (e.g., CO2, H2O)
- diffusion studies (measuring changes in concentration with depth)
- trace element studies
- melt inclusion studies
Check out the latest in the ASU SIMS Lab @asu_SIMSLab on Instagram
This time-lapse shows Rick and I taking off the duoplastmatron source, replacing the canode for testing, and putting it all back together.
The video demonstrates the high mass resolution that can be achieved using SIMS. Our goal is to measure trace Ca in a picroilmenite (MgTiO3). To do this we need to resolve 40 Ca (39.96259) from 24Mg16O (39.97996). The resolution needed to measure trace calcium in ilmenite is ~2300!
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In this video you can see Andrea, Rick, and me disassembling and removing the electron multiplier from the SIMS instrument.
Here I am removing the old electron multiplier, then attaching the leads of the new electron multiplier then secures with screws. Andrea Distel then takes over to replace the O-ring so this piece can stay under vacuum.
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Interested in measuring your sample by SIMS? Contact us at [email protected]